7 results
Surface Rippling & Ion Etch Yields of Diamond Using a Focused Ion Beam: With or Without Enhanced-Chemistry, Aspect Ratio Regulates Ion Etching
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- Journal:
- Microscopy Today / Volume 14 / Issue 6 / November 2006
- Published online by Cambridge University Press:
- 14 March 2018, pp. 28-35
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- November 2006
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Comparative Experimental Study of X-Ray Absorption Spectroscopy and Electron Energy Loss Spectroscopy on Passivated U Surfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 986 / 2006
- Published online by Cambridge University Press:
- 26 February 2011, 0986-OO02-06
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- 2006
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Cryo-FIB for Thinning Cryo-TEM samples and Evading Ice During Cryo-Transfer
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 854-855
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- August 2005
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Feasibility of Focused Ion Beam Milling for Preparation of TEM Specimens of Biological Material Embedded in Vitreous Ice
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 802-803
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- August 2005
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Imaging Defects in Nanometer-scale Semiconductor Crystals: Statistical Nucleation Events are Few in Small Crystals, but can Control Growth
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1622-1623
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- August 2005
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Microstructural Effects on the Hardness, Elastic Modulus and Fracture Toughness of CVD Diamond
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- Journal:
- MRS Online Proceedings Library Archive / Volume 505 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 611
- Print publication:
- 1997
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Microstructural Development to Toughen Sic
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- Journal:
- MRS Online Proceedings Library Archive / Volume 410 / 1995
- Published online by Cambridge University Press:
- 10 February 2011, 257
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- 1995
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